GE DeltaVision OMXv4 Blaze

The Deltavision OMX supports two of the main super resolution techniques: Fast 3D-structured illumination (3D-SIM) for live and fixed samples and localization microscopy (PALM/STORM) for fixed samples. The instrument is equipped to support live cell experiments and offers total internal reflection (TIRF) microscopy and ultra fast widefield multichannel imaging.

Detailed Description

  • Super resolution microscopy
    3D-SIM (double resolution in x,y, and z)
    PALM/STORM (Localization of fluorophores within tens of nanometers)
  • Widefield deconvolution
  • TIRF microscopy
  • Ultrafast multichannel widefield imaging

  •  60x/1.42 UIS2 PLAPON (Oil)  — SIM
  •  60x/1.49 UIS2 APON TIRFM (Oil)  — SIM

  • 405 nm (Diode)
  • 445 nm (Diode)
  • 488 nm (Diode)
  • 514 nm (Diode)
  • 568 nm (Diode)
  • 642 nm (Diode)


6 colour solid state illuminator


  • DAPI, FITC, TRITC, and Cy5
  • DAPI, CFP, and YFP


4 liquid cooled pco sCMOS cameras (5.5 Megapixels)

Widefield and TIRF

up to 1024x1024 pixels


up to 512x512 pixels


15.5 €/h

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