GE DeltaVision OMX Blazev4
The Deltavision OMX supports two of the main super resolution techniques: Fast 3D-structured illumination (3D-SIM) for live and fixed samples and localization microscopy (PALM/STORM) for fixed samples. The instrument is equipped to support live cell experiments and offers total internal reflection (TIRF) microscopy and ultra fast widefield multichannel imaging.